- Auger electron spectrometer
- 俄歇电子能谱仪
English-Chinese electricity dictionary (电气专业词典). 2013.
Auger electron spectrometer
Look at other dictionaries:
Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… … Wikipedia
surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… … Universalium
Fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
Spectrometrie de fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
Spectrométrie de fluorescence X — Pour les articles homonymes, voir SFX, FX et XRF. Un chimiste manipule un goniomètre manuel pour l analyse par spectrométrie de fluorescence X de monocristaux d échant … Wikipédia en Français
Spectrométrie de fluorescence x — Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
X-ray photoelectron spectroscopy — [ right|thumb|350px|Basic components of a monochromatic XPS system.] X ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state… … Wikipedia
X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… … Wikipedia
Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… … Wikipedia
Nobel Prizes — ▪ 2009 Introduction Prize for Peace The 2008 Nobel Prize for Peace was awarded to Martti Ahtisaari, former president (1994–2000) of Finland, for his work over more than 30 years in settling international disputes, many involving ethnic,… … Universalium
